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GI/ITG/GMA Technical Committee "Dependability and Fault Tolerance" (VERFE) and
DFG Priority Program SPP 1500 "Dependable Embedded Systems"
# Call for Papers
#13th Workshop on Dependability and Fault Tolerance (VERFE'17)
in conjunction with 30th ARCS 2017, Vienna, Germany, April 3th - 6th, 2017
### Background and Focus
--------------------
Although the basic reliability of hardware and software components has improved
over decades, their increasing number causes severe problems.
Moreover, in recent years it can be observed that in an increasing number of
devices, e.g. cars, digital components are integrated into environments of
other physical components. Here, the complexity and number of interactions with
these components creates problems with regard to maintaining a dependable
operation of the entire system in case of faults or external disturbances.
While this is not a problem with microprocessors there, shrinking feature sizes,
higher complexity, lower voltages, and higher clock frequencies
increase the probability of design-, manufacturing-, and operational faults,
making fault tolerance techniques in general purpose processors to be of
crucial importance in the future. As simple solutions (such as TMR) easily
can get too expensive, the ability to trade increased reliability against
performance/power overhead will become important, resulting in light-weight
fault tolerance techniques implemented in hardware, but controllable from
higher software layers.
This workshop aims at presenting contributions and work-in-progress from the
research area of dependable and fault tolerant computing in order to bring
together scientists working in related fields.
### Topics
--------------------
Contributions on the topic of "Dependable Embedded Systems" are of
particular interest; contributions on general topics of dependability and
fault tolerance are also welcome but not limited to:
* reliability models for hardware and software
* modeling and simulation of fault-tolerant systems
* fault-tolerant systems and system components
* formal verification of systems
* testing of hardware and software
* fault treatment|
* detection and correction of transient faults
* quantitative assessment of reliability improvements
* safety-critical applications
* timeliness problems
* dependability of networks
* dependability of embedded systems
* highly available systems
* dependable organic computing
* self-organization within redundant systems
* dependable ubiquitous and pervasive computing
* composability of dependable systems
* dependable mechatronic systems / micro systems
* dependability of mobile and wireless systems
* robustness and robustness metrics
* validation and verification
* fault models and fault model abstraction
* fault-injection techniques
* software-controlled fault tolerance
* on-chip backward recovery techniques
* forward recovery techniques (notification of higher layers)
* fault-tolerant caches
* dynamic re-use of currently unused resources in processors for fault-tolerance
### Information for Authors
Accepted papers (>= 3 reviews)
will be published by VDE and IEEExplore and will appear
in ARCS 2017 Workshop Proceedings.
Selected papers will appear in the FERS Journal (ISSN 0724-5319).
The workshop will focus on research presentations
as well as brainstorming sessions.
Therefore, two kinds of contributions are welcome:
* research papers documenting results of scientific investigations and
* position papers proposing strategies or discussing open problems.
### Deadlines:
* Submission: January 8, 2017
(extended abstracts (3-4 pages) or full papers, PDF)
to: bernhard.fechner@fernuni-
* Notification: January 31, 2017
* Camera-ready: February 26, 2017 (max. 13 pages);
VERFE'17 Workshop site: http://arcs2017.itec.kit.edu/
Further information about ARCS 2017: http://arcs2017.itec.kit.edu/
### Workshop Chairs
|Name|Institute|Country|
|----|---------|-------|
|B. Fechner| Univ. of Hagen| DE
|K.-E. Großpietsch| St. Augustin| DE
### Program Committee (TBC)
|Name|Institute|Country|
|----|---------|-------|
| L. Bauer| Karlsruhe Inst. of Technology| DE
| F. Belli| Univ. of Paderborn| DE
| R. Buchty| Karlsruhe Inst. of Technology| DE
| K. Echtle| Univ. of Duisburg-Essen| DE
| W. Ehrenberger| Univ. of Fulda| DE
| R. Ernst| TU Braunschweig| DE
| B. Fechner| Univ. of Hagen| DE
| M. Gössel| Univ. of Potsdam| DE
| K.-E. Großpietsch| St. Augustin| DE
| J. Henkel| Karlsruhe Inst. of Technology| DE
| J. Hursey| Oak Ridge National Lab.| US
| J. Keller| Univ. Hagen| DE
| H.-D. Kochs| Univ. of Duisburg-Essen| DE
| M. Lê| KUKA Augsburg| DE
| P. Limbourg| Univ. of Duisburg-Essen| DE
| M. Malek| Univ. of Lugano| CH
| E. Maehle| Univ. of Lübeck| DE
| M. Mock| Fraunhofer St. Augustin| DE
| E. Nett| Univ. of Magdeburg| DE
| D. Nikolos| Univ. of Patras| DE
| A. Pataricza| Univ. of Budapest| HU
| F. Saglietti| Univ. of Erlangen-Nuremberg| DE
| T. Sato| Univ. of Fukuoka| JP
| M. Schulz| Lawrence Livermore National Lab.| US
| M. Shafique| Karlsruhe Inst. of Technology| DE
| P. Sobe| HTW Dresden| DE
| J. Sosnowski| Univ. of Warsaw| PL
| A. Stopp| Daimler AG Berlin| DE
| C. Trinitis| TU Munich| DE
| P. Tröger| TU Chemnitz| DE
| T. Vierhaus| TU Cottbus| DE
| M. Walter| Siemens AG Nuremberg| DE
| H. Wedde| TU Dortmund| DE
| N. Wehn| TU Kaiserslautern| DE
| J. Weidendorfer| TU Munich| DE
| H.-Y. Youn| Univ. of Sungkyunkwan| KR
| T. Yoneda| Univ. of Tokyo| JP
| S. Zug| Univ. of Magdeburg| DE
******************************
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sent to . If you'd like to opt out of these
announcements, information on how to unsubscribe is available at the
bottom of this email.]
*** Please excuse multiple postings ***
GI/ITG/GMA Technical Committee "Dependability and Fault Tolerance" (VERFE) and
DFG Priority Program SPP 1500 "Dependable Embedded Systems"
# Call for Papers
#13th Workshop on Dependability and Fault Tolerance (VERFE'17)
in conjunction with 30th ARCS 2017, Vienna, Germany, April 3th - 6th, 2017
### Background and Focus
--------------------
Although the basic reliability of hardware and software components has improved
over decades, their increasing number causes severe problems.
Moreover, in recent years it can be observed that in an increasing number of
devices, e.g. cars, digital components are integrated into environments of
other physical components. Here, the complexity and number of interactions with
these components creates problems with regard to maintaining a dependable
operation of the entire system in case of faults or external disturbances.
While this is not a problem with microprocessors there, shrinking feature sizes,
higher complexity, lower voltages, and higher clock frequencies
increase the probability of design-, manufacturing-, and operational faults,
making fault tolerance techniques in general purpose processors to be of
crucial importance in the future. As simple solutions (such as TMR) easily
can get too expensive, the ability to trade increased reliability against
performance/power overhead will become important, resulting in light-weight
fault tolerance techniques implemented in hardware, but controllable from
higher software layers.
This workshop aims at presenting contributions and work-in-progress from the
research area of dependable and fault tolerant computing in order to bring
together scientists working in related fields.
### Topics
--------------------
Contributions on the topic of "Dependable Embedded Systems" are of
particular interest; contributions on general topics of dependability and
fault tolerance are also welcome but not limited to:
* reliability models for hardware and software
* modeling and simulation of fault-tolerant systems
* fault-tolerant systems and system components
* formal verification of systems
* testing of hardware and software
* fault treatment|
* detection and correction of transient faults
* quantitative assessment of reliability improvements
* safety-critical applications
* timeliness problems
* dependability of networks
* dependability of embedded systems
* highly available systems
* dependable organic computing
* self-organization within redundant systems
* dependable ubiquitous and pervasive computing
* composability of dependable systems
* dependable mechatronic systems / micro systems
* dependability of mobile and wireless systems
* robustness and robustness metrics
* validation and verification
* fault models and fault model abstraction
* fault-injection techniques
* software-controlled fault tolerance
* on-chip backward recovery techniques
* forward recovery techniques (notification of higher layers)
* fault-tolerant caches
* dynamic re-use of currently unused resources in processors for fault-tolerance
### Information for Authors
Accepted papers (>= 3 reviews)
will be published by VDE and IEEExplore and will appear
in ARCS 2017 Workshop Proceedings.
Selected papers will appear in the FERS Journal (ISSN 0724-5319).
The workshop will focus on research presentations
as well as brainstorming sessions.
Therefore, two kinds of contributions are welcome:
* research papers documenting results of scientific investigations and
* position papers proposing strategies or discussing open problems.
### Deadlines:
* Submission: January 8, 2017
(extended abstracts (3-4 pages) or full papers, PDF)
to: bernhard.fechner@fernuni-
* Notification: January 31, 2017
* Camera-ready: February 26, 2017 (max. 13 pages);
VERFE'17 Workshop site: http://arcs2017.itec.kit.edu/
Further information about ARCS 2017: http://arcs2017.itec.kit.edu/
### Workshop Chairs
|Name|Institute|Country|
|----|---------|-------|
|B. Fechner| Univ. of Hagen| DE
|K.-E. Großpietsch| St. Augustin| DE
### Program Committee (TBC)
|Name|Institute|Country|
|----|---------|-------|
| L. Bauer| Karlsruhe Inst. of Technology| DE
| F. Belli| Univ. of Paderborn| DE
| R. Buchty| Karlsruhe Inst. of Technology| DE
| K. Echtle| Univ. of Duisburg-Essen| DE
| W. Ehrenberger| Univ. of Fulda| DE
| R. Ernst| TU Braunschweig| DE
| B. Fechner| Univ. of Hagen| DE
| M. Gössel| Univ. of Potsdam| DE
| K.-E. Großpietsch| St. Augustin| DE
| J. Henkel| Karlsruhe Inst. of Technology| DE
| J. Hursey| Oak Ridge National Lab.| US
| J. Keller| Univ. Hagen| DE
| H.-D. Kochs| Univ. of Duisburg-Essen| DE
| M. Lê| KUKA Augsburg| DE
| P. Limbourg| Univ. of Duisburg-Essen| DE
| M. Malek| Univ. of Lugano| CH
| E. Maehle| Univ. of Lübeck| DE
| M. Mock| Fraunhofer St. Augustin| DE
| E. Nett| Univ. of Magdeburg| DE
| D. Nikolos| Univ. of Patras| DE
| A. Pataricza| Univ. of Budapest| HU
| F. Saglietti| Univ. of Erlangen-Nuremberg| DE
| T. Sato| Univ. of Fukuoka| JP
| M. Schulz| Lawrence Livermore National Lab.| US
| M. Shafique| Karlsruhe Inst. of Technology| DE
| P. Sobe| HTW Dresden| DE
| J. Sosnowski| Univ. of Warsaw| PL
| A. Stopp| Daimler AG Berlin| DE
| C. Trinitis| TU Munich| DE
| P. Tröger| TU Chemnitz| DE
| T. Vierhaus| TU Cottbus| DE
| M. Walter| Siemens AG Nuremberg| DE
| H. Wedde| TU Dortmund| DE
| N. Wehn| TU Kaiserslautern| DE
| J. Weidendorfer| TU Munich| DE
| H.-Y. Youn| Univ. of Sungkyunkwan| KR
| T. Yoneda| Univ. of Tokyo| JP
| S. Zug| Univ. of Magdeburg| DE
******************************
(https://lists.mcs.anl.gov/
If you do not remember your password (which is needed to change these options), you can reset it using the "Unsubscribe or Edit Options" button at the bottom of the page.
(https://lists.mcs.anl.gov/
******************************
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